GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon-In-line four-point probe and direct current two-point probe method

Standard Number: GB/T 1551-2021
Chinese:硅单晶电阻率的测定 直排四探针法和直流两探针法
English:Test method for measuring resistivity of monocrystal silicon-In-line four-point probe and direct current two-point probe method

Effective Date:2021-12-01
Regulatory Authority:National Standardization Administration of China
Issuing Regulatory Authority:State Administration for Market Supervision and Administration,National Standardization Administration of China

Adheres to international standards:N
PDF Downloadable:Y

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