GB/T 24581-2022 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon-Low temperature FT-IR analysis method

Standard Number: GB/T 24581-2022
Chinese:硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法
English:Test method for Ⅲ and Ⅴ impurities content in single crystal silicon-Low temperature FT-IR analysis method

Effective Date:2022-10-01
Regulatory Authority:Standardization Administration of PRC (SAC)
Issuing Regulatory Authority:State Administration for Market Supervision and Administration, China National Standardization Administration

Adheres to international standards:N
PDF Downloadable:Y

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