GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films

Standard Number: GB/T 31227-2014
Chinese:原子力显微镜测量溅射薄膜表面粗糙度的方法
English:Test method for the surface roughness by atomic force microscope for sputtered thin films

Effective Date:2015-04-15
Regulatory Authority:Chinese Academy of Sciences
Issuing Regulatory Authority:General Administration of Quality Supervision, Inspection and Quarantine of the People’s Republic of China,National Standardization Administration of China

Adheres to international standards:N
PDF Downloadable:Y

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