GB/T 32188-2015 The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate

Standard Number: GB/T 32188-2015
Chinese:氮化镓单晶衬底片x射线双晶摇摆曲线半高宽测试方法
English:The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate

Effective Date:2016-11-01
Regulatory Authority:National Standardization Administration of China
Issuing Regulatory Authority:General Administration of Quality Supervision, Inspection and Quarantine of the People’s Republic of China,National Standardization Administration of China

Adheres to international standards:N
PDF Downloadable:Y

You can click the button below to purchase the PDF version, and we will send it to you via email.

Click below to buy the printed version. Shipped via FedEx within 7 days. Full refund if out of stock.

If you encounter the following issues, please click here to contact us, and we will do our best to assist you.
1. You cannot find the standard document you are looking for on our website.
2. You have found the standard document, but our page indicates that PDF download is not available.
3. You need to purchase our translated version.