GB/T 32651-2016 Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry

Standard Number: GB/T 32651-2016
Chinese:采用高质量分辨率辉光放电质谱法测量太阳能级硅中痕量元素的测试方法
English:Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry

Effective Date:2016-11-01
Regulatory Authority:National Standardization Administration of China
Issuing Regulatory Authority:General Administration of Quality Supervision, Inspection and Quarantine of the People’s Republic of China,National Standardization Administration of China

Adheres to international standards:N
PDF Downloadable:Y

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