GB/T 35007-2018 Semiconductor integrated circuits-Measuring method of low voltage differential signaling circuitry

Standard Number: GB/T 35007-2018
Chinese:半导体集成电路 低电压差分信号电路测试方法
English:Semiconductor integrated circuits-Measuring method of low voltage differential signaling circuitry

Effective Date:2018-08-01
Regulatory Authority:Ministry of Industry and Information Technology（电子）
Issuing Regulatory Authority:General Administration of Quality Supervision, Inspection and Quarantine of the People’s Republic of China,National Standardization Administration of China

Adheres to international standards:N
PDF Downloadable:Y

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