GB/T 41064-2021 Surface chemical analysis-Depth profiling-Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

Standard Number: GB/T 41064-2021
Chinese:表面化学分析 深度剖析 用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法
English:Surface chemical analysis-Depth profiling-Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

Effective Date:2022-07-01
Regulatory Authority:National Standardization Administration of China
Issuing Regulatory Authority:State Administration for Market Supervision and Administration,National Standardization Administration of China

Adheres to international standards:Y
PDF Downloadable:N

You can click the button below to purchase the PDF version, and we will send it to you via email.

Click below to buy the printed version. Shipped via FedEx within 7 days. Full refund if out of stock.

If you encounter the following issues, please click here to contact us, and we will do our best to assist you.
1. You cannot find the standard document you are looking for on our website.
2. You have found the standard document, but our page indicates that PDF download is not available.
3. You need to purchase our translated version.