GB/T 43087-2023 Microbeam analysis-Analytical electron microscopy-Method for the determination of interface position in the cross-sectional image of the layered materials

Standard Number: GB/T 43087-2023(GB/T43087-2023)
Chinese:微束分析 分析电子显微术 层状材料截面像中界面位置的确定方法
English:Microbeam analysis-Analytical electron microscopy-Method for the determination of interface position in the cross-sectional image of the layered materials

Effective Date:2024-04-01
Regulatory Authority:
National Standardization Administration of China

Issuing Regulatory Authority:State Administration for Market Supervision and Administration,National Standardization Administration of China

Adheres to international standards:Y
PDF Downloadable:N

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