GB/T 4937.2-2006 Semiconductor devices―Mechanical and climatic test methods―Part 2: Low air pressure

Standard Number: GB/T 4937.2-2006
Chinese:半导体器件 机械和气候试验方法 第2部分:低气压
English:Semiconductor devices―Mechanical and climatic test methods―Part 2: Low air pressure

Effective Date:2007-02-01
Regulatory Authority:Ministry of Industry and Information Technology（电子）
Issuing Regulatory Authority:General Administration of Quality Supervision, Inspection and Quarantine of the People’s Republic of China,National Standardization Administration of China

Adheres to international standards:Y
PDF Downloadable:N

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